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Volumn 37, Issue 6, 2002, Pages 631-641

Geometric phase-shifting for low-coherence interference microscopy

(4) Roy, M a Svahn, P b Cherel, L a Sheppard, C J R a

b ROYAL INSTITUTE OF TECHNOLOGY (Sweden)

Author keywords

Coherence probe microscope; Geometric phase; Low coherence interferometry; Optical coherence tomography; Phase shifting; Surface profiling; White light interferometry

Indexed keywords

COHERENT LIGHT; INTERFEROMETRY; LASER OPTICS; LIGHT INTERFERENCE; LIGHT POLARIZATION; OPTICAL BEAM SPLITTERS; TUNGSTEN;

LOW-COHERENCE INTERFEROMETRY;

PHASE SHIFT;

EID: 0036604510 PISSN: 01438166 EISSN: None Source Type: Journal
DOI: 10.1016/S0143-8166(01)00146-4 Document Type: Article

Times cited : (47)

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