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Applied Physics A: Materials Science and Processing

Volumn 74, Issue 6, 2002, Pages 747-753

Magnetic anisotropy of textured CrO2 thin films investigated by X-ray magnetic circular dichroism

(7) Goering, E a Justen, M a Geissler, J a Rudiger U b Rabe, M b Guntherodt G b Schutz G a

a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS (Germany)

b RWTH AACHEN UNIVERSITY (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; CHEMICAL VAPOR DEPOSITION; CHROMIUM COMPOUNDS; CRYSTAL ORIENTATION; CRYSTALLIZATION; ELECTRON DIFFRACTION; LATTICE CONSTANTS; MAGNETIC ANISOTROPY; MAGNETIC MOMENTS; SUBSTRATES; THERMODYNAMIC STABILITY; X RAY DIFFRACTION ANALYSIS;

CHROMIUM DIOXIDE THIN FILM; MOMENT ANALYSIS; X RAY MAGNETIC CIRCULAR DICHROISM;

THIN FILMS;

EID: 0036604378 PISSN: 09478396 EISSN: None Source Type: Journal
DOI: 10.1007/s003390201302 Document Type: Article

Times cited : (16)

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