High temperature reliability testing of aluminum and tantalum electrolytic capacitors

Microelectronics Reliability

Volumn 42, Issue 6, 2002, Pages 835-840

  Dehbi, A ^a   Wondrak, W ^a   Ousten, Y ^b   Danto, Y ^b  

^a DAIMLER AG   (Germany)

^b UNIVERSITÉ DE BORDEAUX   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; DIELECTRIC MATERIALS; ELECTRIC CONDUCTIVITY; ELECTRIC RESISTANCE; ELECTRODES; HIGH TEMPERATURE TESTING; RELIABILITY; SOLID ELECTROLYTES; TANTALUM;

HIGH TEMPERATURE RELIABILITY TESTING;

ELECTROLYTIC CAPACITORS;

EID: 0036603609     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(02)00021-5     Document Type: Article

References (9)

1. Passive components: Requirements by automotive applications
2. Solid Ta capacitors: Polymer vs manganeous oxide electrolytes - A review
3. An update on capacitors for portable electronics
4. Reliability requirements for microtechnologies used in automotive applications
5. Surface mount type aluminum electrolytic capacitors
6. Solid tantalum capacitor
7. Solid tantalum capacitor