A post-processing technique for extending depth of focus in conventional optical microscopy

Optics and Laser Technology

Volumn 34, Issue 4, 2002, Pages 299-305

  Widjanarko, Taufiq ^a,c   Hardie, Russell C ^b  

^a UNIVERSITY OF DAYTON   (United States)

^b University of Dayton   (United States)

^c Virginia Polytechnic Institute and State University   (United States)

Author keywords

Depth of focus; Image processing; Image sequence; Microscopy

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; ERROR ANALYSIS; FOCUSING; OPTICAL MICROSCOPY;

IMAGE SEQUENCES;

IMAGE PROCESSING;

EID: 0036603569     PISSN: 00303992     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-3992(02)00017-8     Document Type: Article

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