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Materials Research Bulletin

Volumn 37, Issue 7, 2002, Pages 1353-1367

Structure and electrical properties of sputtered lithium cobaltite thin films

(5) Rao, K J a,c Benqlilou Moudden, H a Couturier, G b Vinatier, P a Levasseur, A a

a Ecole Nationale Superieure de Chimie et de Physique de Bordeaux (France)

b CNRS (France)

c INDIAN INSTITUTE OF SCIENCE (India)

Author keywords

C. X ray diffraction; D. Electrical properties; D. Microstructure

Indexed keywords

ANNEALING; BAND STRUCTURE; ELECTRIC CONDUCTIVITY; ELECTROCHEMICAL ELECTRODES; ELECTROCHEMISTRY; ELECTRON MICROSCOPY; HEURISTIC METHODS; HIGH TEMPERATURE EFFECTS; LITHIUM COMPOUNDS; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; SPUTTERING; X RAY DIFFRACTION ANALYSIS;

FILM ELECTRODES;

THIN FILMS;

EID: 0036601181 PISSN: 00255408 EISSN: None Source Type: Journal
DOI: 10.1016/S0025-5408(02)00756-0 Document Type: Article

Times cited : (10)

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