SCOPUS 정보 검색 플랫폼

Journal of Materials Research

Volumn 17, Issue 6, 2002, Pages 1520-1528

Preparation and microstructure evolution of both freestanding and supported TiO2 thin films

(4) Fan, Chen Lung a Ciardullo, Daniel a Paladino, Jay a Huebner, Wayne a

a MISSOURI UNIVERSITY OF SCIENCE AND TECHNOLOGY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; GLASS; GRAIN GROWTH; GRAIN SIZE AND SHAPE; HEAT TREATMENT; PHASE TRANSITIONS; POROSITY; SILICON WAFERS; SPIN COATING; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

ANATASE PHASE; COVER GLASS; FREESTANDING FILM; PHASE DEVELOPMENT; RUTILE PHASE; SUPPORTED FILM; TITANIUM CITRATE COMPLEX;

TITANIUM DIOXIDE;

EID: 0036601169 PISSN: 08842914 EISSN: None Source Type: Journal
DOI: 10.1557/JMR.2002.0226 Document Type: Article

Times cited : (12)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.