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Volumn 21, Issue 6, 2002, Pages 613-619

Neural networks method for identification of the objects behind the screen

Author keywords

Electrical impedance tomography; Finite element method; Neural network

Indexed keywords

BRAIN; ELECTRIC IMPEDANCE TOMOGRAPHY; ELECTROMAGNETIC FIELD EFFECTS; FINITE ELEMENT METHOD; INVERSE PROBLEMS; MATHEMATICAL MODELS; NEURAL NETWORKS;

EID: 0036591480     PISSN: 02780062     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMI.2002.800581     Document Type: Article
Times cited : (12)

References (13)
  • 1
    • 0010056435 scopus 로고    scopus 로고
    • Defect identification by Eddy current inspection data classification through probabilistic neural networks with elliptical Kernels
    • Sapporo, Japan, Oct. 25-28, PaperPB3-12
    • (1999) COMPUMAG'99
    • Bianchi, A.1
  • 13
    • 84875379930 scopus 로고    scopus 로고
    • The MathWorks, Inc., Natick, MA
    • (1997) MATLAB


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.