(η3-allyl-2κ3 C) (chloro-1 κCl)(μ-N,N′diethyldithioxamidato- 1:2κ4 S,S′:N,N′)[diphenyl(2-pyridyl)phosphine-1κP]palladium(II)plati num(II) chloroform solvate

Acta Crystallographica Section C: Crystal Structure Communications

Volumn 58, Issue 5, 2002, Pages

  Bruno, Giuseppe ^a   Lanza, Santo ^a   Nicoló, Francesco ^a   Tresoldi, Giuseppe ^a   Rosace, Giuseppe ^a  

^a UNIVERSITY OF MESSINA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; COMPLEXATION; CRYSTAL STRUCTURE; CRYSTALLIZATION; NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY; SYNTHESIS (CHEMICAL); X RAY DIFFRACTION ANALYSIS;

CHELATING LIGANDS;

ORGANOMETALLICS;

EID: 0036587907     PISSN: 01082701     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108270102006303     Document Type: Article

References (16)

1. Antolini, L., Fabretti, A.C., Franchini, G., Menabue, L., Pellacani, G.C., Desseyn, H.O., Dommisse, R. & Hofmans, H.C. (1987). J. Chem. Soc. Dalton Trans. pp. 1921-1928.
2. Cremer, D. & Pople, J.A. (1975). J. Am. Chem. Soc. 97, 1354-1358.
3. Desseyn, H.O., Van deer Veken, B.J. & Hermann, M.A. (1978). Appl. Spectrosc. 32, 101-105.
4. Diamond, R. (1969). Acta Cryst. A25, 43-55.
5. Hurd, R.N., De La Mater, J., McEleheny, G.C., Turner, R. J. & Wallingford, V.H. (1961). J. Org. Chern. 26, 3980-3987.
6. Kopfmann, G. & Huber, R. (1968). Acta Cryst. A24, 348-351.
7. Lanza, S., Bruno, G., Nicoló, F., Rotondo, A., Scopelliti, R. & Rotondo, E. (2000). Organometallics, 19, 2462-2469.
8. Lanza, S., Bruno, G., Nicoló, F. & Scopelliti, R. (1996). Tetrahedron Asymmetry, 7, 3347-3350.
9. Lanza, S., Scolaro, M.L. & Rosace, G. (1994). Inorg. Chim. Acta, 227, 63-69.
10. Nardelli, M. (1995). J. Appl. Cryst. 28, 659.
11. Rosace, G., Bruno, G., Scolaro, M.L., Nicoló, F., Sergi, S. & Lanza, S. (1993). Inorg. Chim. Acta, 208, 1, 59-65.
12. Sheldrick, G.M. (1990). Acta Cryst. A46, 467-473.
13. Sheldrick, G.M. (1997). SHELXL97. University of Göttingen, Germany.
14. Siemens (1989). P3/V. Release 4.21/V. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
15. Siemens (1990). SHELXTL-Plus. VMS release 4.21/V. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
16. Siemens (1996). SHELXTL. Version 5.05. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin USA.