Actions of defect-states in organic light emitting diodes

Guangdianzi Jiguang/Journal of Optoelectronics Laser

Volumn 13, Issue 5, 2002, Pages 445-449

  Wu, Chuan Ya ^a   Xiong, Shao Zhen ^a   Hao, Yun ^a   Chen, You Su ^a   Yang, Hui Dong ^a   Zhou, Zhen Hua ^a   Zhang, Li Zhu ^a  

^a NANKAI UNIVERSITY   (China)

Author keywords

Defect states; F N tunnel effect; Hesitated I V curves; OLED; Trapped Charge Limited current (TCL)

Indexed keywords

DEFECTS; ELECTRIC CHARGE; ELECTRIC CURRENTS; ELECTRIC FIELDS; SEMICONDUCTOR DEVICES;

DEFECT STATES; ORGANIC LIGHT EMITTING DIODES; TRAPPED CHARGE LIMITED CURRENT;

LIGHT EMITTING DIODES;

EID: 0036586757     PISSN: 10050086     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (13)

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