Growth conditions, structural and magnetic properties of M/Fe3O4/I (M = Al, Ag and I = Al2O3, MgO) multilayers

Journal of Magnetism and Magnetic Materials

Volumn 247, Issue 1, 2002, Pages 1-5

  Shah, Prasanna ^a   Sohma, Mitsugu ^a   Kawaguchi, Kenji ^a   Yamaguchi, Iwao ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Epitaxial; MBE; Thin films; X ray photoelectron spectroscopy

Indexed keywords

ALUMINA; ATOMIC FORCE MICROSCOPY; GROWTH (MATERIALS); MAGNETIC PROPERTIES; MAGNETIC THIN FILMS; MAGNETITE; MOLECULAR BEAM EPITAXY; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SURFACE ROUGHNESS; SYNTHESIS (CHEMICAL); X RAY PHOTOELECTRON SPECTROSCOPY;

STRUCTURAL PROPERTIES;

MULTILAYERS;

EID: 0036576803     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-8853(02)00018-5     Document Type: Article

References (8)