In situ luminescence measurement of silica under soft X-ray and γ-ray irradiations

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 191, Issue 1-4, 2002, Pages 382-386

  Yoshida, Tomoko ^a   Tanabe, Tetsuo ^a   Ii, Tatsuya ^a   Yoshida, Hisao ^a  

^a NAGOYA UNIVERSITY   (Japan)

Author keywords

In situ luminescence measurement; Silica glass; Soft X ray; ray

Indexed keywords

ELECTRONS; GAMMA RAYS; IONIZATION; IRRADIATION; LUMINESCENCE; PHOTONS; X RAY ANALYSIS;

SOFT X-RAY;

FUSED SILICA;

EID: 0036573848     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(02)00545-1     Document Type: Article

References (17)