Variation of morphology and color of VO2 thin films induced by excimer laser

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 191, Issue 1-4, 2002, Pages 102-105

  Li Bin, L ^a   Tie Cheng, Lu ^a   Yong, Lu ^a   Qiang, Liu ^a  

^a SICHUAN UNIVERSITY   (China)

Author keywords

Excimer laser; Surface morphology; VO2 thin film

Indexed keywords

COLOR; CRYSTALLIZATION; EXCIMER LASERS; GRAIN SIZE AND SHAPE; LASER BEAM EFFECTS; MORPHOLOGY; PRECIPITATION (CHEMICAL); RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; VANADIUM COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

IRRADIATION ENERGY;

THIN FILMS;

EID: 0036573667     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(02)00520-7     Document Type: Conference Paper

References (12)