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Journal of Optics A: Pure and Applied Optics

Volumn 4, Issue 3, 2002, Pages 303-308

Transmission through a nonlinear thin layer near the critical angle of incidence: Application to the sensitive determination of the nonlinear refractive index

(4) Mountasser, R a Ayadi, M b Lantz, E c Maillotte, H c

a HASSAN II UNIVERSITY OF CASABLANCA (Morocco)

b HASSAN II UNIVERSITY (Morocco)

c UNIVERSITÉ DE FRANCHE COMTÉ (France)

Author keywords

Nonlinear refractive index measurement; Nonlinear thin layer; Optical switching

Indexed keywords

CARBON DISULFIDE; LEAST SQUARES APPROXIMATIONS; LIGHT INTERFERENCE; NONLINEAR OPTICS; OPTICAL SWITCHES; PHOTONS; REFRACTIVE INDEX; RESONANCE; SENSITIVITY ANALYSIS; THIN FILMS; VOLUME FRACTION;

NONLINEAR THIN LAYERS;

LIGHT TRANSMISSION;

EID: 0036572628 PISSN: 14644258 EISSN: None Source Type: Journal
DOI: 10.1088/1464-4258/4/3/315 Document Type: Article

Times cited : (2)

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