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Volumn 190, Issue 1-4, 2002, Pages 497-500
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Trace elements measurement by PIXE in the appraisal of the ancient potteries
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Author keywords
Multivariate statistical analysis; Pottery; Proton induced X ray emission; Provenance
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Indexed keywords
COMPOSITION;
EXCAVATION;
PROTONS;
STATISTICAL METHODS;
X RAY ANALYSIS;
PROTON-INDUCED X-RAY EMISSION (PIXE);
TRACE ELEMENTS;
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EID: 0036569312
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(01)01283-6 Document Type: Conference Paper |
Times cited : (11)
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References (8)
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