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Volumn 190, Issue 1-4, 2002, Pages 177-182

The novel HVEE 5 MV Tandetron™

Author keywords

AMS; Dynamitron; Ion beam analysis; Tandem accelerator; Tandetron

Indexed keywords

COMPUTER SIMULATION; ELECTRIC FIELD EFFECTS; ION BEAMS; ION IMPLANTATION; MASS SPECTROMETRY; POSITRON EMISSION TOMOGRAPHY;

EID: 0036569309     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(02)00458-5     Document Type: Conference Paper
Times cited : (24)

References (2)
  • 1
    • 0008823293 scopus 로고    scopus 로고
    • US patent #5.247.263


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.