PIXE and RBS investigation of growth phases of ultra-thin chemical bath deposited CdS films

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 190, Issue 1-4, 2002, Pages 615-619

  Duncan, P C ^a   Hinckley, S ^a   Gluszak, E A ^a   Dytlewski, N ^b  

^a EDITH COWAN UNIVERSITY   (Australia)

^b AUSTRALIAN NUCLEAR SCIENCE AND TECHNOLOGY ORGANISATION   (Australia)

Author keywords

Atomic force microscopy; Cadmium sulphide; Chemical bath deposition; Proton induced X ray emission; Rutherford backscattering; Semiconductors

Indexed keywords

ATOMIC FORCE MICROSCOPY; CADMIUM SULFIDE; COMPOSITION EFFECTS; DEPOSITION; FILM GROWTH; GLASS; MICROSTRUCTURE; POLYCRYSTALLINE MATERIALS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SEMICONDUCTOR MATERIALS; SUBSTRATES; THERMAL EFFECTS; X RAY ANALYSIS;

CHEMICAL BATH DEPOSITION (CBD);

ULTRATHIN FILMS;

EID: 0036569178     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(01)01277-0     Document Type: Conference Paper

References (3)