Application of VUV laser harmonic radiation to the measurement of porous silicon dielectric function

Optics and Lasers in Engineering

Volumn 37, Issue 5, 2002, Pages 611-620

  De Filippo, F ^a   De Lisio, C ^a   Maddalena, P ^a   Solimeno, S ^a   Lerondel G ^b   Altucci, C ^c  

^a UNIVERSITY OF NAPLES FEDERICO II   (Italy)

^b UNIVERSITÉ DE TECHNOLOGIE DE TROYES   (France)

^c UNIVERSITY OF BASILICATA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

HARMONIC GENERATION; LASER APPLICATIONS; LASER BEAMS; POROUS SILICON; REFLECTION; SEMICONDUCTOR MATERIALS; THIN FILMS; ULTRAVIOLET SPECTROPHOTOMETERS;

LASER HARMONIC RADIATION;

ULTRAVIOLET RADIATION;

EID: 0036568209     PISSN: 01438166     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0143-8166(01)00136-1     Document Type: Article

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