Infrared and Raman study of two-level systems in fiber optic quality a-SiO2 and a-SiO2:GeO2

Physica B: Condensed Matter

Volumn 316-317, Issue , 2002, Pages 531-534

  Hubbard, B E ^a   Agladze, N I ^a   Tu, J J ^a   Sievers, A J ^a  

^a Laboratory of Atomic and Solid State Physics and Sibley School of Mechanical and Aerospace Engineering   (United States)

Author keywords

Far infrared spectroscopy; Raman spectroscopy; Silica; Two level systems

Indexed keywords

DOPING (ADDITIVES); FIBER OPTICS; INFRARED SPECTROSCOPY; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SILICA;

TWO-LEVEL SYSTEMS (TLS);

GLASS;

EID: 0036566928     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(02)00563-X     Document Type: Conference Paper

References (7)