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Volumn 15, Issue 5, 2002, Pages 639-647
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Processing, microstructure and characterization of artificial joins in top seeded melt grown Y-Ba-Cu-O
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Author keywords
[No Author keywords available]
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Indexed keywords
CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY);
CRYSTAL GROWTH FROM MELT;
CRYSTAL MICROSTRUCTURE;
CRYSTAL ORIENTATION;
CURRENT VOLTAGE CHARACTERISTICS;
EPITAXIAL GROWTH;
GRAIN BOUNDARIES;
HEATING;
HIGH TEMPERATURE SUPERCONDUCTORS;
INCLUSIONS;
MAGNETIC PROPERTIES;
OPTICAL MICROSCOPY;
THERMAL EFFECTS;
TRANSMISSION ELECTRON MICROSCOPY;
ARTIFICIAL JOINS;
TOP SEEDED MELT GROWTH;
YTTRIUM BARIUM COPPER OXIDES;
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EID: 0036566742
PISSN: 09532048
EISSN: None
Source Type: Journal
DOI: 10.1088/0953-2048/15/5/301 Document Type: Conference Paper |
Times cited : (23)
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References (31)
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