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Volumn 40, Issue 1-8, 2002, Pages 757-763
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Sensitivity improvement of a pump-probe set-up for thin film and microstructure metrology
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Author keywords
Femtosecond laser acoustics; Laser based ultrasonics; MEMS inspection; Photoacoustics; Pump probe measurement; Thin film metrology
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Indexed keywords
FREQUENCY MODULATION;
LASER PULSES;
LIGHT POLARIZATION;
LIGHT REFLECTION;
METALLIC FILMS;
MICROSTRUCTURE;
MULTILAYERS;
PUMPING (LASER);
SENSITIVITY ANALYSIS;
THERMOELASTICITY;
THIN FILMS;
CROSS-POLARIZATION;
ACOUSTOOPTICAL EFFECTS;
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EID: 0036566302
PISSN: 0041624X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0041-624X(02)00207-X Document Type: Conference Paper |
Times cited : (44)
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References (7)
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