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Volumn 17, Issue 5, 2002, Pages 1183-1191

Growth and characterization of Na0.5K0.5NbO3 thin films on polycrystalline Pt80Ir20 substrates

(7) Wang, Xin a,b Olafsson, Sveinn c Madsen, Lynnette D a,f Rudner, Staffan a,g Ivanov, Ivan P g Grishin, Alex h Helmersson, Ulf a

a LINKÖPING UNIVERSITY (Sweden)

b ACREO AB (Sweden)

c UNIVERSITY OF ICELAND (Iceland)

d CYPRESS SEMICONDUCTOR (United States)

e SWEDISH DEFENCE RESEARCH AGENCY (Sweden)

f CARNEGIE MELLON UNIVERSITY (United States)

g Royal Institute of Technology ^*

h ROYAL INSTITUTE OF TECHNOLOGY (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; FILM GROWTH; MAGNETRON SPUTTERING; MORPHOLOGY; PERMITTIVITY; PLATINUM COMPOUNDS; POLYCRYSTALLINE MATERIALS; PRESSURE EFFECTS; SCANNING ELECTRON MICROSCOPY; SODIUM COMPOUNDS; SUBSTRATES; THERMAL EFFECTS;

GROWTH TEMPERATURE; HYDROSTATIC PIEZOELECTRIC MEASUREMENT; POLYCRYSTALLINE SUBSTRATE; RADIO FREQUENCY MAGNETRON SPUTTERING;

THIN FILMS;

EID: 0036565095 PISSN: 08842914 EISSN: None Source Type: Journal
DOI: 10.1557/JMR.2002.0175 Document Type: Article

Times cited : (27)

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