Sub-micron external electro-optic testing technique

Guangxue Xuebao/Acta Optica Sinica

Volumn 22, Issue 5, 2002, Pages 607-611

  Chen, Zhanguo ^a   Jia, Gang ^a   Yi, Maobin ^a   Li, Hailan ^a   Wu, Zhifa ^a   Liu, Yunlong ^a   Zhou, Zhixiong ^a   Zhao, Chao ^a  

^a JILIN UNIVERSITY   (China)

Author keywords

Electro optic measurement; Solid immersion lens; Spatial resolution; Sub micron

Indexed keywords

ARSENIC; GALLIUM; LENSES; PROBES;

LINEAR RESPONSE; SOLID IMMERSION LENS; SPATIAL RESOLUTION; SUBMICRON;

ELECTROOPTICAL DEVICES;

EID: 0036559037     PISSN: 02532239     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (10)

1. Picosecond electro-optic sampling system
2. New measurement technique: CW electro-optic probing of electric fields
3. An automated electro-optic probing system for ultra-high-speed IC's
4. An external electrooptic sampling technique based on the Fabry-Perot effect
5. Electro-opticfield mapping system utilizing external gallium arsenide probes
6. Picosecond optical sampling of GaAs integrated circuits
7. Time resolved near-field scanning optical microscopy
8. Solid immersion microscope
9. Near-field optical data storage using a solid immersion lens
10. Near-field phase change optical recording using a GaP hemispherical lens