Noisy logo recognition using line segment Hausdorff distance

Pattern Recognition

Volumn 36, Issue 4, 2003, Pages 943-955

  Chen, Jingying ^a   Leung, Maylor K ^a   Gao, Y Yongsheng ^a  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

Hausdorff distance; Line; Logo matching; Shape

Indexed keywords

COMPUTATIONAL GEOMETRY; SPATIAL VARIABLES MEASUREMENT; SPURIOUS SIGNAL NOISE; STRUCTURAL ANALYSIS;

LOGOS;

PATTERN RECOGNITION;

PATTERN RECOGNITION;

EID: 0036556062     PISSN: 00313203     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0031-3203(02)00128-0     Document Type: Article

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