Finding representative patterns with ordered projections

Pattern Recognition

Volumn 36, Issue 4, 2003, Pages 1009-1018

  Riquelme, José C ^a   Aguilar Ruiz, Jesús S ^a   Toro, Miguel ^a  

^a UNIVERSITY OF SEVILLE   (Spain)

Author keywords

Axis parallel classifiers; Data mining; Pattern analysis; Preprocessing techniques

Indexed keywords

DATA REDUCTION; LEARNING ALGORITHMS;

ORDERED PROJECTIONS;

PATTERN RECOGNITION;

PATTERN RECOGNITION;

EID: 0036555992     PISSN: 00313203     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0031-3203(02)00119-X     Document Type: Article

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