SCOPUS 정보 검색 플랫폼

Surface Review and Letters

Volumn 9, Issue 2, 2002, Pages 693-698

Spin-resolved photoelectron spectroscopy of ultrathin Fe films on GaAs(001)

(8) Takahashi, N a Zhang, T b,c Spangenberg, M b,c Greig, D c Shen, T H b Cornelius, S d Seddon, E A d Matthew, J A D e

a KAGAWA UNIVERSITY (Japan)

b UNIVERSITY OF SALFORD (United Kingdom)

c UNIVERSITY OF LEEDS (United Kingdom)

d DARESBURY LABORATORY (United Kingdom)

e UNIVERSITY OF YORK (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ARSENIC DERIVATIVE; GALLIUM; IRON; SILICON;

ANALYTIC METHOD; CONCENTRATION (PARAMETERS); CONFERENCE PAPER; ELECTRON; FILM; GEOMETRY; MAGNETISM; STOICHIOMETRY; SURFACE PROPERTY; SYNCHROTRON RADIATION; THICKNESS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0036553497 PISSN: 0218625X EISSN: None Source Type: Journal
DOI: 10.1142/S0218625X02002816 Document Type: Conference Paper

Times cited : (4)

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