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Surface Review and Letters

Volumn 9, Issue 2, 2002, Pages 937-941

Epitaxy of ultrathin CoO films studied by XPD and GIXRD

(10) Luches, P a Giovanardi, C a Moia, T a Valeri, S a Bruno, F b Floreano, L b Gotter, R b Verdini, A b Morgante, A b,c Santaniello, A d

a UNIVERSITY OF MODENA AND REGGIO EMILIA (Italy)

b LABORATORIO TASC (Italy)

c UNIVERSITY OF TRIESTE (Italy)

d SINCROTRONE TRIESTE (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COBALT DERIVATIVE; OXIDE; OXYGEN;

CHEMICAL STRUCTURE; CONFERENCE PAPER; DIFFRACTION; EXPOSURE; FILM; SURFACE PROPERTY; SYNCHROTRON; THICKNESS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0036552937 PISSN: 0218625X EISSN: None Source Type: Journal
DOI: 10.1142/S0218625X0200324X Document Type: Conference Paper

Times cited : (6)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.