Effects of additives on the interfacial microstructure of cofired electrode-ceramic multilayer systems

Journal of the American Ceramic Society

Volumn 85, Issue 4, 2002, Pages 787-793

  Zuo, Ruzhong ^a   Li, Longtu ^a,b   Gui, Zhilun ^a   Hu, Xiaobing ^a   Ji, Chengxiang ^a  

^a TSINGHUA UNIVERSITY   (China)

^b AMERICAN CERAMIC SOCIETY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; CRYSTAL MICROSTRUCTURE; DEGRADATION; DENSIFICATION; ELECTRIC CONDUCTIVITY; ELECTRODES; ELECTRONIC PROPERTIES; MULTILAYERS; PALLADIUM; PEROVSKITE; SCANNING ELECTRON MICROSCOPY; SHRINKAGE; SILVER; SINTERING; SURFACE CHEMISTRY; X RAY DIFFRACTION ANALYSIS;

MELTING POINTS;

FERROELECTRIC CERAMICS;

EID: 0036544990     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.2002.tb00173.x     Document Type: Article

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