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Journal of the American Ceramic Society

Volumn 85, Issue 4, 2002, Pages 844-850

Effect of a transverse tensile stress on the electric-field-induced domain reorientation in soft PZT: In situ XRD study

(6) Li, Xiaoping a,c Shih, Wan Y a,c Vartuli, James S b Milius, David L b Aksay, Ilhan A b,c Shih, Wei Heng a,c

a Drexel University (United States)

b Princeton University (United States)

c AMERICAN CERAMIC SOCIETY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELD EFFECTS; LEAD COMPOUNDS; PIEZOELECTRIC MATERIALS; TENSILE STRESS; X RAY DIFFRACTION ANALYSIS;

DOMAIN REORIENTATION;

CERAMIC MATERIALS;

EID: 0036544984 PISSN: 00027820 EISSN: None Source Type: Journal
DOI: 10.1111/j.1151-2916.2002.tb00182.x Document Type: Article

Times cited : (51)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.