MFM imaging of patterned permalloy elements under an external applied field

Journal of Magnetism and Magnetic Materials

Volumn 242-245, Issue , 2002, Pages 1267-1269

  Garcia J M ^a   Thiaville, A ^a   Miltat, J ^a   Kirk, K J ^b   Chapman, J N ^b  

^a UNIVERSITÉ PARIS SUD   (France)

^b UNIVERSITY OF GLASGOW   (United Kingdom)

Author keywords

Domain structure; Magnetic force microscopy; Micromagnetic calculations; Permalloy

Indexed keywords

ASPECT RATIO; MAGNETIC DOMAINS; MAGNETIC FIELD EFFECTS; MAGNETIC FLUX; PERTURBATION TECHNIQUES;

MAGNETIC FORCE MICROSCOPY (MFM); PERMALLOYS;

MAGNETIZATION;

EID: 0036543844     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-8853(01)01027-7     Document Type: Article

References (14)