Broadening of the x-ray emission line due to the instrumental function of the double-crystal spectrometer

Physical Review A. Atomic, Molecular, and Optical Physics

Volumn 65, Issue 4, 2002, Pages 425021-425026

  Tochio, T ^a   Ito, Y ^a   Omote, K ^b  

^a KYOTO UNIVERSITY   (Japan)

^b RIGAKU CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; COPPER; CRYSTALS; LIGHT EMISSION; RADIATION EFFECTS; SILICON; SPECTRUM ANALYSIS;

DOUBLE-CRYSTAL SPECTROMETERS;

X RAY SPECTROMETERS;

EID: 0036542292     PISSN: 10502947     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevA.65.042502     Document Type: Article

References (6)