Development of new steady-state, low-energy, and high-flux ion beam test device

Review of Scientific Instruments

Volumn 73, Issue 4, 2002, Pages 1741-

  Shimada, Tomohisa ^a   Ueda, Yoshio ^a   Sagara, Akio ^a   Nishikawa, Masahiro ^a  

^a OSAKA UNIVERSITY   (Japan)

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Indexed keywords

EID: 0036541649     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1461873     Document Type: Article

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