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Volumn 299-302, Issue , 2002, Pages 626-631
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Density of states in hydrogenated microcrystalline silicon determined by space charge limited currents
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Author keywords
[No Author keywords available]
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Indexed keywords
ANISOTROPY;
CRYSTALLINE MATERIALS;
ELECTRIC SPACE CHARGE;
ELECTRONIC DENSITY OF STATES;
FERMI LEVEL;
HYDROGENATION;
MICROSTRUCTURE;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
SPACE CHARGE LIMITED CURRENTS (SCLC);
SILICON;
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EID: 0036540549
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-3093(01)00970-X Document Type: Article |
Times cited : (5)
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References (17)
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