Logarithmic distributions in reliability analysis

Microelectronics Reliability

Volumn 42, Issue 4-5, 2002, Pages 779-786

  Jones, B K ^a  

^a LANCASTER UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

FRACTALS; HARMONIC GENERATION; LINEAR SYSTEMS; NONLINEAR SYSTEMS; RELIABILITY; SPURIOUS SIGNAL NOISE;

LOGARITHMIC DISTRIBUTIONS; RELIABILITY ANALYSIS;

LARGE SCALE SYSTEMS;

EID: 0036540139     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(02)00031-8     Document Type: Article

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