Optical semiconductor device reliability

Microelectronics Reliability

Volumn 42, Issue 4-5, 2002, Pages 679-683

  Fukuda, Mitsuo ^a  

^a NTT CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DEGRADATION; DENSE WAVELENGTH DIVISION MULTIPLEXING; FIBER OPTIC NETWORKS; FREQUENCY MODULATION; PHOTODIODES; RELIABILITY;

OPTICAL FIBER NETWORKS;

SEMICONDUCTOR LASERS;

EID: 0036539393     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(02)00022-7     Document Type: Article

References (4)

1. Semiconductor device reliability
2. Historical overview and future of optoelectronics reliability for optical fiber communication systems
3. Highly reliable spot-size converter integrated laser diodes over a wide temperature range for access network systems
4. Junction lasers which operate continuously at room temperature