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Volumn 93, Issue 4, 2002, Pages 322-329
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Quantitative analysis of aluminium alloys using SIMS
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Author keywords
Aluminium alloys; Microstructure; SIMS; Solid solution
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Indexed keywords
CALCULATIONS;
CHEMICAL ANALYSIS;
GRAIN BOUNDARIES;
IONIZATION;
ISOTOPES;
MATHEMATICAL MODELS;
MICROSTRUCTURE;
MOLECULES;
SECONDARY ION MASS SPECTROMETRY;
SENSITIVITY ANALYSIS;
SOLID SOLUTIONS;
SPUTTERING;
CONCENTRATION PROFILES;
EQUILIBRIUM CONCENTRATION;
IONISATION PROBABILITY;
MATRIX EFFECT;
MICROPROBE ANALYSIS;
MOLECULAR INTERFERENCE;
RELATIVE SENSITIVITY FACTOR;
SPUTTERING DEPTH;
SPUTTERING SPEED;
SPUTTERING VELOCITY;
ALUMINUM ALLOYS;
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EID: 0036538603
PISSN: 00443093
EISSN: None
Source Type: Journal
DOI: 10.3139/146.020322 Document Type: Article |
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Times cited : (5)
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References (11)
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