Formation process of nanocrystalline materials from x-ray diffraction profile analysis: Application to platinum catalysts

Journal of Applied Physics

Volumn 91, Issue 7, 2002, Pages 4556-4561

  Ascarelli, P ^a   Contini, V ^b   Giorgi, R ^b  

^a CNR   (Italy)

^b ENEA C R CASACCIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE SIZE; DIFFRACTION PROFILES; FORMATION PROCESS; GROWTH MECHANISMS; LINE-BROADENING ANALYSIS; MICROSTRUCTURAL CHARACTERISTICS; NANOCRYSTALLINE SAMPLE; OSTWALD RIPENING PROCESS; PLATINUM CATALYSTS; PLATINUM NANOPARTICLES; SIMPLE METHOD; X-RAY LINE PROFILE ANALYSIS;

COALESCENCE; ELECTROCATALYSTS; OSTWALD RIPENING; PLATINUM; X RAY DIFFRACTION;

SIZE DISTRIBUTION;

EID: 0036536532     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1453495     Document Type: Article

References (10)

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