Self-oscillation mode induced in an atomic force microscope cantilever

Journal of Applied Physics

Volumn 91, Issue 7, 2002, Pages 4715-4719

  Kim, Kiwoong ^a   Lee, Soonchil ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPE CANTILEVERS; CANTILEVER OSCILLATION; DAMPING PARAMETERS; DYNAMIC HEAT CAPACITY; FIBER-OPTIC INTERFEROMETERS; FREQUENCY MODULATION ATOMIC FORCE MICROSCOPY; METAL-COATED; MODEL ANALYSIS; NORMAL FORCES; PHOTO-THERMAL; SELF-OSCILLATION MODES; SELF-OSCILLATIONS; SINGLE OPTICAL FIBERS; THERMAL COEFFICIENTS;

ATOMIC FORCE MICROSCOPY; OPTICAL FIBERS;

NANOCANTILEVERS;

EID: 0036535996     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1454225     Document Type: Article

References (11)

1. T. R. Albrecht, P. Grütter, D. Horne, and D. Rugar, J. Appl. Phys. 69, 668 (1991). jap JAPIAU 0021-8979
2. F. J. Giessibl, Science 267, 68 (1995). sci SCIEAS 0036-8075
3. F. J. Giessibl and M. Tortonese, Appl. Phys. Lett. 70, 2529 (1997). apl APPLAB 0003-6951
4. S. Yamamoto and H. Yamada, Langmuir 13, 4861 (1997). lan LANGD5 0743-7463
5. I. Revenko and R. Proksch, J. Appl. Phys. 87, 526 (2000). jap JAPIAU 0021-8979
6. K. J. Bruland, J. L. Garbini, W. M. Dougherty, and J. A. Sidles, J. Appl. Phys. 80, 1959 (1996). jap JAPIAU 0021-8979
7. G. C. Ratcliff, D. A. Erie, and R. Superfine, Appl. Phys. Lett. 72, 1911 (1998). apl APPLAB 0003-6951
8. D. Rugar, H. J. Mamin, and P. Guethner, Appl. Phys. Lett. 55, 2588 (1989). apl APPLAB 0003-6951
9. Y. J. Rao and B. Culshaw, Electron. Lett. 27, 1697 (1991). ell ELLEAK 0013-5194
10. T. R. Albrecht, P. Grütter, D. Rugar, and D. P. E. Smith, Ultramicroscopy 42-44, 1638 (1992). ult ULTRD6 0304-3991
11. K. J. Bruland, J. L. Garbini, W. M. Dougherty, S. H. Chao, S. E. Jensen, and J. A. Sidles, Rev. Sci. Instrum. 70, 3542 (1999). rsi RSINAK 0034-6748