Nonlinear dynamics of a noncontacting atomic force microscope cantilever actuated by a piezoelectric layer

Journal of Applied Physics

Volumn 91, Issue 7, 2002, Pages 4701-4709

  Wolf, K ^a   Gottlieb, O ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPE CANTILEVERS; EVOLUTION EQUATIONS; FORCED VIBRATION; FREQUENCY RESPONSE FUNCTIONS; FREQUENCY SHIFT; HAMILTON'S PRINCIPLE; LAGRANGIAN; LENNARD-JONES TYPE; MICRO BEAMS; MULTIPLE SCALES METHODS; PERIODIC SOLUTION; PERTURBATION ANALYSIS; PIEZOELECTRIC LAYERS; PIEZOELECTRIC LEAD ZIRCONATE TITANATES; SILICON CANTILEVER BEAM; SMALL DISPLACEMENT; THIRD ORDER; VIRTUAL WORKS; VOLTAGE EXCITATIONS;

EQUATIONS OF MOTION; FREQUENCY RESPONSE;

ATOMIC FORCE MICROSCOPY;

EID: 0036535926     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1458056     Document Type: Article

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