Environmental monitoring of trace elements in bark of Scots pine by thick-target PIXE

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 189, Issue 1-4, 2002, Pages 163-167

  Harju, L ^a   Saarela, K E ^a   Rajander, J ^a   Lill, J O ^a   Lindroos, A ^a   Heselius, S J ^a  

^a ÅBO AKADEMI UNIVERSITY   (Finland)

Author keywords

Bark; Environmental pollution; Heavy metals; PIXE; Scots pine

Indexed keywords

BARK STRIPPING; COMPOSITION; HEAVY METALS; IONS; POLLUTION DETECTION; TRACE ELEMENTS; X RAY ANALYSIS;

PARTICLE-INDUCED X-RAY EMISSION (PIXE);

ENVIRONMENTAL TESTING;

BARK; HEAVY METALS; IONS; POLLUTION; TRACE ELEMENTS; X RAY ANALYSIS;

EID: 0036535515     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(01)01031-X     Document Type: Conference Paper

References (11)