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Volumn 33, Issue 4, 2002, Pages 367-368
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Summary of ISO/TC 201 standard: V ISO 14975:2000 - Surface chemical analysis - Data information formats
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Author keywords
Data formats; Database; International standards; Spectra
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Indexed keywords
AUGER ELECTRON SPECTROSCOPY;
CALIBRATION;
CHEMICAL ANALYSIS;
DATA TRANSFER;
DATABASE SYSTEMS;
SPECTRUM ANALYSIS;
STANDARDS;
X RAY PHOTOELECTRON SPECTROSCOPY;
SURFACE CHEMICAL ANALYSIS;
SURFACE CHEMISTRY;
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EID: 0036535366
PISSN: 01422421
EISSN: None
Source Type: Journal
DOI: 10.1002/sia.1193 Document Type: Article |
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Times cited : (5)
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References (2)
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