Ion beam analysis with external beams: Recent set-up improvements

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 188, Issue 1-4, 2002, Pages 135-140

  Calligaro, T ^a   Dran, J C ^a   Moignard, B ^a   Pichon, L ^a   Salomon, J ^a   Walter, Ph ^a  

^a CENTRE DE RECHERCHE ET DE RESTAURATION DES MUSÉES DE FRANCE   (France)

Author keywords

External beam; PIXE; RBS

Indexed keywords

CHEMICAL ANALYSIS; POSITIVE IONS; PROTON BEAMS; VACUUM;

ION BEAM ANALYSIS (IBA);

ION BEAMS;

EID: 0036535044     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(01)01062-X     Document Type: Conference Paper

References (13)