Applications of PIXE to mineral characterization

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 189, Issue 1-4, 2002, Pages 387-393

  Wilson, Graham C ^a,b   Rucklidge, John C ^a   Campbell, John L ^c   Nejedly, Zdenek ^c   Teesdale, William J ^c  

^a UNIVERSITY OF TORONTO   (Canada)

^b Turnstone Geological Services Ltd   (Canada)

^c UNIVERSITY OF GUELPH   (Canada)

Author keywords

Applied mineralogy; Electron microprobe analysis; Metals; Oxides; Proton induced X ray emission; Sulphides; Sulphosalts

Indexed keywords

CHARACTERIZATION; METAL REFINING; MINERAL RESOURCES; OXIDES; PRECIOUS METALS; PROTONS; TEXTURES; TRACE ELEMENTS; X RAY ANALYSIS;

MINERAL CHARACTERIZATION; PROTON-INDUCED X-RAY EMISSION (PIXE);

MINERALS;

EID: 0036534545     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(01)01095-3     Document Type: Conference Paper

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