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Volumn 481, Issue 1-3, 2002, Pages 183-187

On the behavior of ion implanted silicon strip detectors in high intensity low energy heavy ion beam experiments

Author keywords

Leakage current; Silicon Strip Detector; Stable beam; Static charge

Indexed keywords

HEAVY IONS; ION BEAMS; ION IMPLANTATION; LEAKAGE CURRENTS; SILICON;

EID: 0036534095     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(01)01352-3     Document Type: Article
Times cited : (3)

References (7)
  • 5
    • 0008692440 scopus 로고    scopus 로고
    • Private communication, Micron Semiconductor Ltd.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.