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Volumn 46, Issue 7, 2002, Pages 501-505
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The measurements of particle/crystallite size in nanostructured TiO2 films by SAXS/WAXD method
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Author keywords
Annealing; Film; Microstructure; Small angle X ray scattering; Titanium dioxide; Wide angle X ray diffraction
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Indexed keywords
ANNEALING;
CARRIER CONCENTRATION;
CHEMICAL VAPOR DEPOSITION;
GRAIN SIZE AND SHAPE;
MICROSTRUCTURE;
NANOSTRUCTURED MATERIALS;
SOL-GELS;
X RAY DIFFRACTION ANALYSIS;
X RAY SCATTERING;
SMALL ANGLE X-RAY SCATTERING (SAXS);
WIDE ANGLE X-RAY DIFFRACTION (WAXD);
TITANIUM DIOXIDE;
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EID: 0036533683
PISSN: 13596462
EISSN: None
Source Type: Journal
DOI: 10.1016/S1359-6462(02)00021-0 Document Type: Article |
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Times cited : (11)
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References (8)
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