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Volumn 46, Issue 4, 2002, Pages 601-603
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Simple determination of the profile of bulk generation lifetime in semiconductor
a
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Author keywords
Linear sweep MOS C t transient; Profile of generation lifetime
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Indexed keywords
CAPACITANCE;
CARRIER CONCENTRATION;
CHARGE CARRIERS;
ELECTRIC CONDUCTIVITY;
ELECTRIC POTENTIAL;
ELECTRIC SPACE CHARGE;
GATES (TRANSISTOR);
PERMITTIVITY;
SILICON WAFERS;
SUBSTRATES;
LINEAR-SWEEP VOLTAGES;
MOS CAPACITORS;
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EID: 0036533263
PISSN: 00381101
EISSN: None
Source Type: Journal
DOI: 10.1016/S0038-1101(01)00246-5 Document Type: Article |
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Times cited : (3)
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References (6)
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