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Volumn 72, Issue 1-4, 2002, Pages 361-371
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Study of an argon-hydrogen RF inductive thermal plasma torch used for silicon deposition by optical emission spectroscopy
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Author keywords
Hydrogenation; Optical emission spectroscopy; Plasma diagnostic
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Indexed keywords
ARGON;
CRYSTALLOGRAPHY;
DEPOSITION;
DIFFUSION;
DISLOCATIONS (CRYSTALS);
ELECTRONIC DENSITY OF STATES;
ELECTRONIC PROPERTIES;
EMISSION SPECTROSCOPY;
HYDROGEN;
HYDROGENATION;
PLASMA DIAGNOSTICS;
PLASMA TORCHES;
SUBSTRATES;
OPTICAL EMISSION SPECTROSCOPY (OES);
THERMAL PLASMA TORCHES;
SEMICONDUCTING SILICON;
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EID: 0036533188
PISSN: 09270248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0927-0248(01)00184-2 Document Type: Conference Paper |
Times cited : (12)
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References (7)
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