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Solid-State Electronics

Volumn 46, Issue 4, 2002, Pages 481-485

Observation of photoinduced shot noise in planar Mo/n-Si/Mo structures with undepleted region

(5) Niemcharoen, S a Ando, T b Supadech, S a Yasumura, Y a Sato, K b

a KING MONGKUT'S INSTITUTE OF TECHNOLOGY LADKRABANG (Thailand)

b TOKAI UNIVERSITY (Japan)

Author keywords

Mo n Si Mo; Noise suppression; Planar metal semiconductor metal structure; Semiconductor photodetector; Shot noise

Indexed keywords

CHARGE CARRIERS; NOISE ABATEMENT; PHOTOCURRENTS; PHOTODETECTORS; PHOTOLITHOGRAPHY; SCHOTTKY BARRIER DIODES; SHOT NOISE;

PHOTOINDUCED CURRENTS;

SEMICONDUCTOR DEVICE STRUCTURES;

EID: 0036533145 PISSN: 00381101 EISSN: None Source Type: Journal
DOI: 10.1016/S0038-1101(01)00303-3 Document Type: Article

Times cited : (3)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.