Thickness dependence of structural, magnetic properties and reversal mechanism of Co-Cr-Ta/Cr longitudinal recording media

Journal of Magnetism and Magnetic Materials

Volumn 242-245, Issue PART I, 2002, Pages 395-397

  Kim, P L ^a,b   Lodder, J C ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

^b HANOI UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Viet Nam)

Author keywords

Coercivity, angular dependence; Crystal structure; Magnetic recording media; Reversal mechanism

Indexed keywords

COBALT; COERCIVE FORCE; CRYSTAL STRUCTURE; MORPHOLOGY; TEXTURES; X RAY DIFFRACTION ANALYSIS;

MAGNETIC RECORDING MEDIA;

MAGNETIC RECORDING;

EID: 0036531132     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-8853(01)01234-3     Document Type: Article

References (8)