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Volumn 242-245, Issue PART I, 2002, Pages 521-524
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FMR studies of ultrathin permalloy layers sandwiched by Al2O3
a
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Author keywords
Ferromagnetic resonance; Line broadening; Permalloy thin films; Stress induced anisotropy
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Indexed keywords
ALUMINA;
DAMPING;
DIELECTRIC MATERIALS;
FERROMAGNETIC RESONANCE;
MAGNETIC ANISOTROPY;
MAGNETIC RELAXATION;
MAGNETIC RESONANCE MEASUREMENT;
MAGNETIZATION;
MAGNETOSTRICTION;
MICA;
MULTILAYERS;
SEMICONDUCTING SILICON;
SPUTTER DEPOSITION;
TUNNEL JUNCTIONS;
X RAY DIFFRACTION ANALYSIS;
GILBERT DAMPING PARAMETER;
PERMALLOY THIN FILMS;
MAGNETIC THIN FILMS;
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EID: 0036530972
PISSN: 03048853
EISSN: None
Source Type: Journal
DOI: 10.1016/S0304-8853(01)01091-5 Document Type: Article |
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Times cited : (12)
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References (7)
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