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Volumn 23, Issue 1-4, 2002, Pages 80-84
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Shallow defect states in hydrogenated amorphous silicon oxide
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Author keywords
Cluster Bethe lattice method; Defect states; Density of states; Silicon oxide
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Indexed keywords
AMORPHOUS SILICON;
ANNEALING;
CONCENTRATION (PROCESS);
CRYSTAL DEFECTS;
ELECTRONIC DENSITY OF STATES;
ENERGY GAP;
HYDROGEN BONDS;
HYDROGENATION;
OXYGEN;
PHOTOLUMINESCENCE;
SHALLOW DEFECTS;
SILICA;
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EID: 0036530828
PISSN: 09270256
EISSN: None
Source Type: Journal
DOI: 10.1016/S0927-0256(01)00236-1 Document Type: Conference Paper |
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Times cited : (2)
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References (23)
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